Profile flags: a novel metaphor for probing of T2 maps

M. Mlejnek, P. Ermes, Anna Vilanova, R. van der Rijt, Harrie C.M. van den Bosch, Frans A. Gerritsen, E. Gröller

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

6 Citaten (Scopus)

Samenvatting

This paper describes a tool for visualization of T2 maps of knee cartilage. Given the anatomical scan and the T2 map of the cartilage, we combine the information on the shape and the quality of the cartilage in a single image. The Profile Flag is an intuitive 3D glyph for probing and annotating of the underlying data. It comprises a bulletin board pin-like shape with a small flag on top of it. While moving the glyph along the reconstructed surface of an object, the curve data measured along the pin's needle and in its neighborhood are shown on the flag. The application area of the Profile Flag is manifold, enabling the visualization of pro le data of dense but inhomogeneous objects. Furthermore, it extracts the essential part of the data without removing or even reducing the context information. By sticking Profile Flags into the investigated structure, one or more signifi cant locations can be annotated by showing the local characteristics of the data at that locations. In this paper we are demonstrating the properties of the tool by visualizing T2 maps of knee cartilage.URL:http://www.cg.tuwien.ac.at/research/vis/comrade/
Originele taal-2Engels
TitelIEEE Visualization 2005
RedacteurenC. Silva
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's599-606
ISBN van geprinte versie0-7803-9462-3
DOI's
StatusGepubliceerd - 2005
EvenementIEEE Visualization 2005 (VIS 2005), October 23-28, 2005, Minneapolis, MN, USA - Minneapolis, MN, Verenigde Staten van Amerika
Duur: 23 okt 200528 okt 2005

Congres

CongresIEEE Visualization 2005 (VIS 2005), October 23-28, 2005, Minneapolis, MN, USA
Verkorte titelVIS 2005
Land/RegioVerenigde Staten van Amerika
StadMinneapolis, MN
Periode23/10/0528/10/05
AnderVIS 2005 : IEEE Visualization Conference ; (Minnepolis, Minn.) : 2005.10.23-28

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