Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

Originele taal-2Engels
TitelDutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006)
StatusGepubliceerd - 2006

Citeer dit

Adam, O. A. O., Kurnosikov, O., Swagten, H. J. M., & Jonge, de, W. J. M. (2006). Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities. In Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006)
Adam, O.A.O. ; Kurnosikov, O. ; Swagten, H.J.M. ; Jonge, de, W.J.M. / Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities. Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006). 2006.
@inproceedings{9d0e71da1dda456fbf01eb5eb069b9a3,
title = "Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities",
author = "O.A.O. Adam and O. Kurnosikov and H.J.M. Swagten and {Jonge, de}, W.J.M.",
year = "2006",
language = "English",
booktitle = "Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006)",

}

Adam, OAO, Kurnosikov, O, Swagten, HJM & Jonge, de, WJM 2006, Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities. in Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006).

Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities. / Adam, O.A.O.; Kurnosikov, O.; Swagten, H.J.M.; Jonge, de, W.J.M.

Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006). 2006.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

TY - GEN

T1 - Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities

AU - Adam, O.A.O.

AU - Kurnosikov, O.

AU - Swagten, H.J.M.

AU - Jonge, de, W.J.M.

PY - 2006

Y1 - 2006

M3 - Conference contribution

BT - Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006)

ER -

Adam OAO, Kurnosikov O, Swagten HJM, Jonge, de WJM. Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities. In Dutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006). 2006