Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry

O. Muraza, E.V. Rebrov, M. Creatore, W. Keuning, W.M.M. Kessels, M.H.J.M. Croon, de, M.C.M. Sanden, van de, J.C. Schouten

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

Originele taal-2Engels
TitelBook of Abstracts Netherlands' Catalysis and Chemistry Conference
Plaats van productieNetherlands, Noordwijkerhout
Pagina'sP104,-page 256
StatusGepubliceerd - 2007

Citeer dit

Muraza, O., Rebrov, E. V., Creatore, M., Keuning, W., Kessels, W. M. M., Croon, de, M. H. J. M., ... Schouten, J. C. (2007). Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry. In Book of Abstracts Netherlands' Catalysis and Chemistry Conference (blz. P104,-page 256). Netherlands, Noordwijkerhout.