Polymer patterning with self-heating atomic force microscope probes

H. Tunc Ciftci, Laurent Pham Van, Bert Koopmans, Oleg Kurnosikov (Corresponding author)

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Scanning probe-assisted patterning methods already demonstrated a high degree of capabilities on submicrometer scales. However, the throughput is still far from its potential because of complexity or fragility of the probes for exploiting thermal effects, chemical reactions, and voltage-induced processes in various patterning operations. Here, we present a new approach to thermomechanical patterning by implementing a multitasking atomic force microscopy (AFM) probe: the functionalized planar probes. In this method, we can generate a tunable thermal gradient between the tip and the sample, wherein they remain in the noncontact regime. In principle, the capillary instability provoked by the van der Waals interaction yields a pull-off force toward the tip. Hence, locally rising protrusions form features at any selected position on a polymer surface without any chemical reaction or irreversible transformation. These multitasking probe-integrated AFMs can pave the way for a remarkable freedom in determining the operation regime on submicrometer surface-patterning applications.

Originele taal-2Engels
Pagina's (van-tot)8036-8042
Aantal pagina's7
TijdschriftJournal of Physical Chemistry A
Volume123
Nummer van het tijdschrift37
DOI's
StatusGepubliceerd - 19 sep 2019

Vingerafdruk

Polymers
Microscopes
microscopes
Heating
heating
probes
polymers
Multitasking
Chemical reactions
chemical reactions
atomic force microscopy
Thermal effects
Thermal gradients
temperature effects
Atomic force microscopy
Throughput
Scanning
gradients
scanning
Electric potential

Citeer dit

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abstract = "Scanning probe-assisted patterning methods already demonstrated a high degree of capabilities on submicrometer scales. However, the throughput is still far from its potential because of complexity or fragility of the probes for exploiting thermal effects, chemical reactions, and voltage-induced processes in various patterning operations. Here, we present a new approach to thermomechanical patterning by implementing a multitasking atomic force microscopy (AFM) probe: the functionalized planar probes. In this method, we can generate a tunable thermal gradient between the tip and the sample, wherein they remain in the noncontact regime. In principle, the capillary instability provoked by the van der Waals interaction yields a pull-off force toward the tip. Hence, locally rising protrusions form features at any selected position on a polymer surface without any chemical reaction or irreversible transformation. These multitasking probe-integrated AFMs can pave the way for a remarkable freedom in determining the operation regime on submicrometer surface-patterning applications.",
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Polymer patterning with self-heating atomic force microscope probes. / Ciftci, H. Tunc; Van, Laurent Pham; Koopmans, Bert; Kurnosikov, Oleg (Corresponding author).

In: Journal of Physical Chemistry A, Vol. 123, Nr. 37, 19.09.2019, blz. 8036-8042.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

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