Photoconductive sampling with a scanning tunneling microscope

O. Gielkens; L.M.F. Kaufmann; E. Smalbrugge; M.R. Melloch; R.H.M. Groeneveld; T.H.M. Rasing; H. Kempen, van

Photoconductive sampling with a scanning tunneling microscope

O. Gielkens, L.M.F. Kaufmann, E. Smalbrugge, M.R. Melloch, R.H.M. Groeneveld, T.H.M. Rasing, H. Kempen, van

Photonic Integration

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic

Originele taal-2	Engels
Titel	Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998
Redacteuren	T. Elsaesser, J.G. Fujimoto, D.A. Wiersma, W. Zinth
Plaats van productie	Berlin
Uitgeverij	Springer
Pagina's	162-164
Aantal pagina's	3
ISBN van geprinte versie	3-540-65430-5
Status	Gepubliceerd - 1998

Publicatie series

Naam	Springer Series in Chemical Engineering
Volume	63

Citeer dit

Gielkens, O., Kaufmann, L. M. F., Smalbrugge, E., Melloch, M. R., Groeneveld, R. H. M., Rasing, T. H. M., & Kempen, van, H. (1998). Photoconductive sampling with a scanning tunneling microscope. In T. Elsaesser, J. G. Fujimoto, D. A. Wiersma, & W. Zinth (editors), Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998 (blz. 162-164). (Springer Series in Chemical Engineering; Vol. 63). Springer.

Gielkens, O. ; Kaufmann, L.M.F. ; Smalbrugge, E. et al. / Photoconductive sampling with a scanning tunneling microscope. Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998. redacteur / T. Elsaesser ; J.G. Fujimoto ; D.A. Wiersma ; W. Zinth. Berlin : Springer, 1998. blz. 162-164 (Springer Series in Chemical Engineering).

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Gielkens, O, Kaufmann, LMF, Smalbrugge, E, Melloch, MR, Groeneveld, RHM, Rasing, THM & Kempen, van, H 1998, Photoconductive sampling with a scanning tunneling microscope. in T Elsaesser, JG Fujimoto, DA Wiersma & W Zinth (uitgave), Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998. Springer Series in Chemical Engineering, vol. 63, Springer, Berlin, blz. 162-164.

Photoconductive sampling with a scanning tunneling microscope. / Gielkens, O.; Kaufmann, L.M.F.; Smalbrugge, E. et al.
Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998. uitgave / T. Elsaesser; J.G. Fujimoto; D.A. Wiersma; W. Zinth. Berlin: Springer, 1998. blz. 162-164 (Springer Series in Chemical Engineering; Vol. 63).

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic

TY - CHAP

T1 - Photoconductive sampling with a scanning tunneling microscope

AU - Gielkens, O.

AU - Kaufmann, L.M.F.

AU - Smalbrugge, E.

AU - Melloch, M.R.

AU - Groeneveld, R.H.M.

AU - Rasing, T.H.M.

AU - Kempen, van, H.

PY - 1998

Y1 - 1998

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SN - 3-540-65430-5

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BT - Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998

A2 - Elsaesser, T.

A2 - Fujimoto, J.G.

A2 - Wiersma, D.A.

A2 - Zinth, W.

PB - Springer

CY - Berlin

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Gielkens O, Kaufmann LMF, Smalbrugge E, Melloch MR, Groeneveld RHM, Rasing THM et al. Photoconductive sampling with a scanning tunneling microscope. In Elsaesser T, Fujimoto JG, Wiersma DA, Zinth W, redacteurs, Ultrafast Phenomena XI : Proceedings of the 11th International Conference, Garmisch-Partenkirchen, Germany, July 12-17, 1998. Berlin: Springer. 1998. blz. 162-164. (Springer Series in Chemical Engineering).