Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems

Willem Jansen; Martijn Anthonissen; Jan ten Thije Boonkkamp; Wilbert IJzerman

doi:10.1364/FREEFORM.2025.FrM4A.2

Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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Phase space ray tracing is an alternative to (Quasi-)Monte Carlo ray tracing in 2D. We introduce a 3D phase space algorithm and apply it to the compound parabolic concentrator to compute the intensity profile.

Originele taal-2	Engels
Titel	Optica Design and Fabrication Congress 2025 (FlatOptics, Freeform, OFT)
Uitgeverij	Optica Publishing Group
Aantal pagina's	2
ISBN van elektronische versie	978-1-957171-45-6
DOI's	https://doi.org/10.1364/FREEFORM.2025.FrM4A.2
Status	Gepubliceerd - 2025
Evenement	2025 Freeform Optics, Freeform 2025 - Denver, Verenigde Staten van Amerika Duur: 16 jun. 2025 → 19 jun. 2025

Congres

Congres	2025 Freeform Optics, Freeform 2025
Land/Regio	Verenigde Staten van Amerika
Stad	Denver
Periode	16/06/25 → 19/06/25

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© Optica Publishing Group 2025 © 2025 The Author(s)

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10.1364/FREEFORM.2025.FrM4A.2

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title = "Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems",

abstract = "Phase space ray tracing is an alternative to (Quasi-)Monte Carlo ray tracing in 2D. We introduce a 3D phase space algorithm and apply it to the compound parabolic concentrator to compute the intensity profile.",

author = "Willem Jansen and Martijn Anthonissen and \{ten Thije Boonkkamp\}, Jan and Wilbert IJzerman",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2025 {\textcopyright} 2025 The Author(s); 2025 Freeform Optics, Freeform 2025 ; Conference date: 16-06-2025 Through 19-06-2025",

year = "2025",

doi = "10.1364/FREEFORM.2025.FrM4A.2",

language = "English",

booktitle = "Optica Design and Fabrication Congress 2025 (FlatOptics, Freeform, OFT)",

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address = "United States",

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Jansen, W , Anthonissen, M , ten Thije Boonkkamp, J & IJzerman, W 2025, Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems. in Optica Design and Fabrication Congress 2025 (FlatOptics, Freeform, OFT)., FrM4A.2, Optica Publishing Group, 2025 Freeform Optics, Freeform 2025, Denver, Verenigde Staten van Amerika, 16/06/25. https://doi.org/10.1364/FREEFORM.2025.FrM4A.2

Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems. / Jansen, Willem ; Anthonissen, Martijn ; ten Thije Boonkkamp, Jan et al.
Optica Design and Fabrication Congress 2025 (FlatOptics, Freeform, OFT). Optica Publishing Group, 2025. FrM4A.2.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems

AU - Jansen, Willem

AU - Anthonissen, Martijn

AU - ten Thije Boonkkamp, Jan

AU - IJzerman, Wilbert

PY - 2025

Y1 - 2025

N2 - Phase space ray tracing is an alternative to (Quasi-)Monte Carlo ray tracing in 2D. We introduce a 3D phase space algorithm and apply it to the compound parabolic concentrator to compute the intensity profile.

AB - Phase space ray tracing is an alternative to (Quasi-)Monte Carlo ray tracing in 2D. We introduce a 3D phase space algorithm and apply it to the compound parabolic concentrator to compute the intensity profile.

UR - https://www.scopus.com/pages/publications/105032353819

U2 - 10.1364/FREEFORM.2025.FrM4A.2

DO - 10.1364/FREEFORM.2025.FrM4A.2

M3 - Conference contribution

AN - SCOPUS:105032353819

BT - Optica Design and Fabrication Congress 2025 (FlatOptics, Freeform, OFT)

PB - Optica Publishing Group

T2 - 2025 Freeform Optics, Freeform 2025

Y2 - 16 June 2025 through 19 June 2025

ER -

Phase Space Ray Tracing for Three-Dimensional Rotationally Symmetric Optical Systems

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