Part I:Practical Problems in the electron-probe micro-analysis of ultra-light elements. Part II: theperformance of various recent matrix correction procedures on ultra light element data

G.F. Bastin, H.J.M. Heijligers

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

Originele taal-2Engels
TitelProceedings of the symposium Microanalysis in materials science today - practical aspects
Plaats van productieHelsinki
StatusGepubliceerd - 1987
Evenementconference; symposium Microanalysis in materials science today - practical aspects, University of Technology Helsinki, 17 -18-02-1987 -
Duur: 1 jan. 1987 → …

Congres

Congresconference; symposium Microanalysis in materials science today - practical aspects, University of Technology Helsinki, 17 -18-02-1987
Periode1/01/87 → …
Andersymposium Microanalysis in materials science today - practical aspects, University of Technology Helsinki, 17 -18-02-1987

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