Outlier detection to identify artefacts in EEG signals

P.J.M. Cluitmans, M. Velde, van de

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
TitelProc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4
UitgeverijIEEE Engineering in Medicine and Biology Society
StatusGepubliceerd - 2000
Evenement22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000 - Chicago, Verenigde Staten van Amerika
Duur: 23 jul. 200028 jul. 2000
Congresnummer: 22

Congres

Congres22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000
Verkorte titelEMBC 2000
Land/RegioVerenigde Staten van Amerika
StadChicago
Periode23/07/0028/07/00
Ander22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL

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