Oscillatory behaviour of the interlayer coupling with the thickness of the Cu cap layer in Co/Cu(100)

J.J. de Vries, A.A.P. Schudelaro, R. Jungblut, W.J.M. de Jonge

Onderzoeksoutput: Bijdrage aan tijdschriftCongresartikelAcademicpeer review

4 Citaties (Scopus)

Uittreksel

The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can be explained.

Originele taal-2Engels
Pagina's (van-tot)257-258
Aantal pagina's2
TijdschriftJournal of Magnetism and Magnetic Materials
Volume156
Nummer van het tijdschrift1-3
DOI's
StatusGepubliceerd - 1 jan 1996
Evenement1995 2nd International Symposium on Metallic Multilayers, MML - Cambridge, UK
Duur: 11 sep 199514 sep 1995

Vingerafdruk

caps
interlayers
Exchange coupling
Molecular beam epitaxy
oscillations

Citeer dit

@article{54d8693670614c008ba269ccd212a2ad,
title = "Oscillatory behaviour of the interlayer coupling with the thickness of the Cu cap layer in Co/Cu(100)",
abstract = "The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can be explained.",
author = "{de Vries}, J.J. and A.A.P. Schudelaro and R. Jungblut and {de Jonge}, W.J.M.",
year = "1996",
month = "1",
day = "1",
doi = "10.1016/0304-8853(95)00859-4",
language = "English",
volume = "156",
pages = "257--258",
journal = "Journal of Magnetism and Magnetic Materials",
issn = "0304-8853",
publisher = "Elsevier",
number = "1-3",

}

Oscillatory behaviour of the interlayer coupling with the thickness of the Cu cap layer in Co/Cu(100). / de Vries, J.J.; Schudelaro, A.A.P.; Jungblut, R.; de Jonge, W.J.M.

In: Journal of Magnetism and Magnetic Materials, Vol. 156, Nr. 1-3, 01.01.1996, blz. 257-258.

Onderzoeksoutput: Bijdrage aan tijdschriftCongresartikelAcademicpeer review

TY - JOUR

T1 - Oscillatory behaviour of the interlayer coupling with the thickness of the Cu cap layer in Co/Cu(100)

AU - de Vries, J.J.

AU - Schudelaro, A.A.P.

AU - Jungblut, R.

AU - de Jonge, W.J.M.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can be explained.

AB - The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can be explained.

UR - http://www.scopus.com/inward/record.url?scp=0030124627&partnerID=8YFLogxK

U2 - 10.1016/0304-8853(95)00859-4

DO - 10.1016/0304-8853(95)00859-4

M3 - Conference article

AN - SCOPUS:0030124627

VL - 156

SP - 257

EP - 258

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - 1-3

ER -