Optimal closed-loop identification test design for internal model control

Y. Zhu; P.P.J. Bosch, van den

doi:10.1016/S0005-1098(00)00034-0

Optimal closed-loop identification test design for internal model control

Y. Zhu, P.P.J. Bosch, van den

Control Systems

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

28 Citaten (Scopus)

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In this work, optimal closed-loop test design for control is studied. Simple design formulas are derived based on the asymptotic theory of Ljung. The control scheme used is internal model control (IMC) and the design constraint is the power of the process output or that of the reference signal. The test signal is applied at the setpoint. The results give clear guidelines for closed-loop identification applications.

Originele taal-2	Engels
Pagina's (van-tot)	1237-1241
Aantal pagina's	5
Tijdschrift	Automatica
Volume	36
Nummer van het tijdschrift	8
DOI's	https://doi.org/10.1016/S0005-1098(00)00034-0
Status	Gepubliceerd - 2000

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Optimal closed-loop identification test design for internal model control

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