Optical characterization of a point-plate micro plasma

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
TitelProceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010
Plaats van productieParis, France
UitgeverijGEC
StatusGepubliceerd - 2010
Evenement63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas, Paris, France - Paris, Frankrijk
Duur: 4 okt 20108 okt 2010

Congres

Congres63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas, Paris, France
Verkorte titelGEC 63
LandFrankrijk
StadParis
Periode4/10/108/10/10
Ander63rd Gaseous Electronics Conference, Paris, France

Citeer dit

Pemen, A. J. M., Huiskamp, T., & Heesch, van, E. J. M. (2010). Optical characterization of a point-plate micro plasma. In Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010 Paris, France: GEC.
Pemen, A.J.M. ; Huiskamp, T. ; Heesch, van, E.J.M. / Optical characterization of a point-plate micro plasma. Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010. Paris, France : GEC, 2010.
@inproceedings{288006d21d4440a5ac251368eb79ea91,
title = "Optical characterization of a point-plate micro plasma",
author = "A.J.M. Pemen and T. Huiskamp and {Heesch, van}, E.J.M.",
year = "2010",
language = "English",
booktitle = "Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010",
publisher = "GEC",

}

Pemen, AJM, Huiskamp, T & Heesch, van, EJM 2010, Optical characterization of a point-plate micro plasma. in Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010. GEC, Paris, France, 63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas, Paris, France, Paris, Frankrijk, 4/10/10.

Optical characterization of a point-plate micro plasma. / Pemen, A.J.M.; Huiskamp, T.; Heesch, van, E.J.M.

Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010. Paris, France : GEC, 2010.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

TY - GEN

T1 - Optical characterization of a point-plate micro plasma

AU - Pemen, A.J.M.

AU - Huiskamp, T.

AU - Heesch, van, E.J.M.

PY - 2010

Y1 - 2010

M3 - Conference contribution

BT - Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010

PB - GEC

CY - Paris, France

ER -

Pemen AJM, Huiskamp T, Heesch, van EJM. Optical characterization of a point-plate micro plasma. In Proceedings of the 63rd Gaseous Electronics Conference, Paris France, 4-8 October 2010. Paris, France: GEC. 2010