Open standard test framework for photonic integrated circuits

Sylwester Latkowski; Dzmitry Pustakhod; Michail Chatzimichailidis; Xaveer Leijtens; Kevin Williams

doi:10.1109/ICTON.2019.8840336

Open standard test framework for photonic integrated circuits

Sylwester Latkowski, Dzmitry Pustakhod, Michail Chatzimichailidis, Xaveer Leijtens, Kevin Williams

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Samenvatting

Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.

Originele taal-2	Engels
Titel	21st International Conference on Transparent Optical Networks, ICTON 2019
Plaats van productie	Piscataway
Uitgeverij	IEEE Computer Society
Aantal pagina's	4
ISBN van elektronische versie	9781728127798
DOI's	https://doi.org/10.1109/ICTON.2019.8840336
Status	Gepubliceerd - 1 jul 2019
Evenement	21st International Conference on Transparent Optical Networks, ICTON 2019 - Angers, Frankrijk Duur: 9 jul 2019 → 13 jul 2019 http://www.icton2019.com/index.php

Congres

Congres	21st International Conference on Transparent Optical Networks, ICTON 2019
Verkorte titel	ICTON2019
Land	Frankrijk
Stad	Angers
Periode	9/07/19 → 13/07/19
Internet adres	http://www.icton2019.com/index.php

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10.1109/ICTON.2019.8840336

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Citeer dit

@inproceedings{56db35122f7b4ad7b80d371352acccec,

title = "Open standard test framework for photonic integrated circuits",

abstract = "Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.",

keywords = "Integrated photonics, Photonic integrated circuits, Photonic integration, Test, Test automation",

author = "Sylwester Latkowski and Dzmitry Pustakhod and Michail Chatzimichailidis and Xaveer Leijtens and Kevin Williams",

year = "2019",

month = jul,

day = "1",

doi = "10.1109/ICTON.2019.8840336",

language = "English",

booktitle = "21st International Conference on Transparent Optical Networks, ICTON 2019",

publisher = "IEEE Computer Society",

address = "United States",

note = "21st International Conference on Transparent Optical Networks, ICTON 2019, ICTON2019 ; Conference date: 09-07-2019 Through 13-07-2019",

url = "http://www.icton2019.com/index.php",

}

Latkowski, S , Pustakhod, D , Chatzimichailidis, M , Leijtens, X & Williams, K 2019, Open standard test framework for photonic integrated circuits. in 21st International Conference on Transparent Optical Networks, ICTON 2019., Sa.A5.4 , IEEE Computer Society, Piscataway, 21st International Conference on Transparent Optical Networks, ICTON 2019, Angers, Frankrijk, 9/07/19. https://doi.org/10.1109/ICTON.2019.8840336

Open standard test framework for photonic integrated circuits. / Latkowski, Sylwester ; Pustakhod, Dzmitry ; Chatzimichailidis, Michail ; Leijtens, Xaveer ; Williams, Kevin.

21st International Conference on Transparent Optical Networks, ICTON 2019. Piscataway : IEEE Computer Society, 2019. Sa.A5.4 .

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Open standard test framework for photonic integrated circuits

AU - Latkowski, Sylwester

AU - Pustakhod, Dzmitry

AU - Chatzimichailidis, Michail

AU - Leijtens, Xaveer

AU - Williams, Kevin

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.

AB - Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.

KW - Integrated photonics

KW - Photonic integrated circuits

KW - Photonic integration

KW - Test

KW - Test automation

UR - http://www.scopus.com/inward/record.url?scp=85073059411&partnerID=8YFLogxK

U2 - 10.1109/ICTON.2019.8840336

DO - 10.1109/ICTON.2019.8840336

M3 - Conference contribution

AN - SCOPUS:85073059411

BT - 21st International Conference on Transparent Optical Networks, ICTON 2019

PB - IEEE Computer Society

CY - Piscataway

T2 - 21st International Conference on Transparent Optical Networks, ICTON 2019

Y2 - 9 July 2019 through 13 July 2019

ER -