On the thickness of the disturbed layer on ground quartz powder with particle size of 1·5 μm

K. Koopmans, G.D. Rieck

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3 Citaten (Scopus)

Samenvatting

The thickness of the disturbed layer in a quartz powder with an average particle size of 1·5 μm has been determined by chemical analysis combined with x-ray peak intensity measurements. At the same time a lower limit to this thickness has been determined by an x-ray diffraction line-profile method, developed earlier by the authors. The difference between both results (0·09 and >or=0·22 μm respectively) may be accounted for, at least partly, by accepting 'locked strains' in the deformed crystals.

Originele taal-2Engels
Artikelnummer418
Pagina's (van-tot)1913-1914
Aantal pagina's2
TijdschriftBritish Journal of Applied Physics
Volume16
Nummer van het tijdschrift12
DOI's
StatusGepubliceerd - 1 dec 1965

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