On the influence of coding on the mean time to failure for degrading memories with defects

A.J. Vinck, K.A. Post

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

1 Citaat (Scopus)

Samenvatting

The application of a combined test-error-correcting procedure is studied to improve the mean time to failure (MTTF) for degrading memory systems with defects. The degradation is characterized by the probability p that within a unit of time a memory cell changes from the operational state to the permanent defect state. Bounds are given on the MTTF and it is shown that, for memories with N words of k information bits, coding gives an improvement in MTTF proportional to (k/n) N(dmin-2)/(dmin -1), where dmin and (k/n) are the minimum distance and the efficiency of the code used, respectively. Thus the time gain for a simple minimum-distance-3 is proportional to N-1. A memory word test is combined with a simple defect-matching code. This yields reliable operation with one defect in a word of length k+2 at a code efficiency k/(k+2).
Originele taal-2Engels
Pagina's (van-tot)902-906
TijdschriftIEEE Transactions on Information Theory
Volume35
Nummer van het tijdschrift4
DOI's
StatusGepubliceerd - 1989

Vingerafdruk

Duik in de onderzoeksthema's van 'On the influence of coding on the mean time to failure for degrading memories with defects'. Samen vormen ze een unieke vingerafdruk.

Citeer dit