On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections

Marco Gagino; Alonso Millan-Mejia; Erwin Bente; Victor Dolores-Calzadilla

doi:10.1007/978-3-031-63378-2_80

On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections

Marco Gagino, Alonso Millan-Mejia, Erwin Bente, Victor Dolores-Calzadilla

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.

Originele taal-2	Engels
Titel	The 25th European Conference on Integrated Optics
Subtitel	Proceedings of ECIO 2024, June 17–19, Aachen, Germany
Redacteuren	Jeremy Witzens, Joyce Poon, Lars Zimmermann, Wolfgang Freude
Uitgeverij	Springer
Pagina's	493-499
Aantal pagina's	7
ISBN van elektronische versie	978-3-031-63378-2
ISBN van geprinte versie	978-3-031-63377-5, 978-3-031-63380-5
DOI's	https://doi.org/10.1007/978-3-031-63378-2_80
Status	Gepubliceerd - 16 jun. 2024
Evenement	25th European Conference on Integrated Optics, ECIO 2024 - Aachen, Duitsland Duur: 17 jun. 2024 → 19 jun. 2024

Publicatie series

Naam	Springer Proceedings in Physics
Volume	402
ISSN van geprinte versie	0930-8989
ISSN van elektronische versie	1867-4941

Congres

Congres	25th European Conference on Integrated Optics, ECIO 2024
Land/Regio	Duitsland
Stad	Aachen
Periode	17/06/24 → 19/06/24

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10.1007/978-3-031-63378-2_80

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Gagino, M., Millan-Mejia, A., Bente, E., & Dolores-Calzadilla, V. (2024). On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. In J. Witzens, J. Poon, L. Zimmermann, & W. Freude (editors), The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany (blz. 493-499). (Springer Proceedings in Physics; Vol. 402). Springer. https://doi.org/10.1007/978-3-031-63378-2_80

Gagino, Marco ; Millan-Mejia, Alonso ; Bente, Erwin et al. / On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. redacteur / Jeremy Witzens ; Joyce Poon ; Lars Zimmermann ; Wolfgang Freude. Springer, 2024. blz. 493-499 (Springer Proceedings in Physics).

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title = "On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections",

abstract = "We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.",

keywords = "Calibration, Integrated Photonics, Optical Phased Array",

author = "Marco Gagino and Alonso Millan-Mejia and Erwin Bente and Victor Dolores-Calzadilla",

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Gagino, M, Millan-Mejia, A, Bente, E & Dolores-Calzadilla, V 2024, On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. in J Witzens, J Poon, L Zimmermann & W Freude (uitgave), The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. Springer Proceedings in Physics, vol. 402, Springer, blz. 493-499, 25th European Conference on Integrated Optics, ECIO 2024, Aachen, Duitsland, 17/06/24. https://doi.org/10.1007/978-3-031-63378-2_80

On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. / Gagino, Marco; Millan-Mejia, Alonso; Bente, Erwin et al.
The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. uitgave / Jeremy Witzens; Joyce Poon; Lars Zimmermann; Wolfgang Freude. Springer, 2024. blz. 493-499 (Springer Proceedings in Physics; Vol. 402).

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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AB - We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.

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Gagino M, Millan-Mejia A, Bente E , Dolores-Calzadilla V. On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. In Witzens J, Poon J, Zimmermann L, Freude W, redacteurs, The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. Springer. 2024. blz. 493-499. (Springer Proceedings in Physics). doi: 10.1007/978-3-031-63378-2_80

On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections

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