Observation of dynamic extinction ratio and bit error rate degradation due to thermal effects in integrated modulators

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Samenvatting

We experimentally demonstrate how the thermal crosstalk between active and passive components limits the performance of integrated Mach-Zehnder modulators operating in radiofrequency regime. To evaluate the role of the distance between active and passive components, the MZs are placed at different distances with respect to a Semiconductor Optical Amplifier that represents the heat source. The thermal crosstalk is quantified by measuring the effects on the electro-optical response of MZ modulators considered as test structure. Both extinction ratio and bit error rate degradation are measured. The proposed investigation allows the introduction of design rules, based on the minimum distance between components to ultimately avoid unwanted thermal effects. According to the result provided by our analysis, we also show how the ER degradation can be recovered.

Originele taal-2Engels
TitelIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015
UitgeverijOptical Society of America (OSA)
ISBN van geprinte versie9781557520005
DOI's
StatusGepubliceerd - 1 jan 2015
EvenementIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015 - Boston, Verenigde Staten van Amerika
Duur: 27 jun 20151 jul 2015

Congres

CongresIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015
LandVerenigde Staten van Amerika
StadBoston
Periode27/06/151/07/15

Vingerafdruk Duik in de onderzoeksthema's van 'Observation of dynamic extinction ratio and bit error rate degradation due to thermal effects in integrated modulators'. Samen vormen ze een unieke vingerafdruk.

  • Citeer dit

    Gilardi, G., Yao, W., Smit, M. K., & Wale, M. J. (2015). Observation of dynamic extinction ratio and bit error rate degradation due to thermal effects in integrated modulators. In Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015 [JM3A.18] Optical Society of America (OSA). https://doi.org/10.1364/IPRSN.2015.JM3A.18