Novel Digital Pre-Correction Method For Mismatch in DACs with Built-In-Self Measurement

In this paper, a solution is proposed for the design of reliable, high-performance current-steering DACs in modern submicron technologies. In addition to the technology-trend of decreasing dimensions, an integration trend of mixed-signal cores (ADCs and DACs) with digital systems on a single chip can be observed. While the digital parts benefit from new technologies (lower power consumption and smaller chip area), the design of accurate, reliable and technology-portable analog circuits becomes more and more complicated. Moreover, the analog cores will be responsible for most of the yield and test problems of the mixed-signal systems-on-chip (MSSoC). The proposed solution is to use a smart approach [1], taking full advantage of on-chip available digital processing power, in order to solve the aforementioned problems.