Novel Diagnostics to Assess Stress-Depth Profiles and Mechanics in Multi-Layer Thin Films

Onderzoeksoutput: Scriptie › Dissertatie 1 (Onderzoek TU/e / Promotie TU/e)

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Originele taal-2	Engels
Kwalificatie	Doctor in de Filosofie
Toekennende instantie	Mechanical Engineering
Begeleider(s)/adviseur	Hoefnagels, Johan P.M., Promotor Geers, Marc G.D., Promotor van der Sluis, Olaf, Co-Promotor
Datum van toekenning	19 dec. 2024
Plaats van publicatie	Eindhoven
Uitgever	Eindhoven University of Technology
Gedrukte ISBN's	978-94-6510-353-2
Elektronische ISBN's	978-90-386-6201-5
Status	Gepubliceerd - 19 dec. 2024

Proefschrift.

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@phdthesis{35df57baa86e4394a09bf595755c6369,

title = "Novel Diagnostics to Assess Stress-Depth Profiles and Mechanics in Multi-Layer Thin Films",

author = "Martens, {Robin Francis Martin}",

note = "Proefschrift.",

year = "2024",

month = dec,

day = "19",

language = "English",

isbn = "978-94-6510-353-2",

publisher = "Eindhoven University of Technology",

type = "Phd Thesis 1 (Research TU/e / Graduation TU/e)",

school = "Mechanical Engineering",

}