@inproceedings{8b036969551a4948ac303bd969394e28,
title = "Normalised 1/f noise: a more sensitive diagnostic tool for hot-carrier degradation in submicron MOSFET's",
author = "X. Li and L.K.J. Vandamme",
year = "1994",
language = "English",
pages = "131--134",
booktitle = "Proc. 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis",
note = "conference; Proc. 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994 ; Conference date: 01-01-1994",
}