Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

P. Sakian Dezfuli, E.J.G. Janssen, J.A.J. Essing, R. Mahmoudi, A.H.M. Roermund, van

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Samenvatting

On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differential 60GHz circuits. The need for expensive four-port mm-wave vector network analyzers is circumvented by using magic-Ts, providing a minimum CMRR of 20dB, in combination with cheaper two-port mm-wave network analyzers. Waveguide interfaces are used in the vicinity of the RF probes to achieve a robust and repeatable setup, as the cables at mm-wave frequencies are prone to impedance and delay variation due to movement and bending. The noise figure of a double-balanced 60GHz mixer and the noise figure and s-parameters of a differential 60GHz LNA are measured using this setup and the measurement results are in good agreement with the simulations.
Originele taal-2Engels
TitelProceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's1-4
ISBN van geprinte versie978-1-4244-7447-9
DOI's
StatusGepubliceerd - 2010
Evenementconference; ARFTG; 2010-11-30; 2010-12-01 -
Duur: 30 nov 20101 dec 2010

Congres

Congresconference; ARFTG; 2010-11-30; 2010-12-01
Periode30/11/101/12/10
AnderARFTG

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  • Citeer dit

    Sakian Dezfuli, P., Janssen, E. J. G., Essing, J. A. J., Mahmoudi, R., & Roermund, van, A. H. M. (2010). Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits. In Proceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida (blz. 1-4). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ARFTG76.2010.5700051