Noise analysis of a BJT-based charge pump for low-noise PLL applications

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6 Citaten (Scopus)

Samenvatting

Noise of the charge pump degrades the in-band phase noise of charge pump phase-locked loop (CPPLL). This paper analyzes the noise mechanism of a bipolar junction transistor based charge pump and validates the analysis through simulation, providing necessary insight into the design of low-noise charge pump for CPPLL-based frequency synthesizers. A simple model for bipolar transistor noise is utilized to carry out the noise analysis. The scaling effects of the duty cycle and the rise/fall time of the input signals on the charge pump noise are also analyzed in detail. The analysis reveals that increased charge pump current reduces the PLL phase noise and that a trade-off exists between the area and the noise of the charge pump.
Originele taal-2Engels
Titel2017 European Conference on Circuit Theory and Design, ECCTD 2017
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Aantal pagina's4
ISBN van elektronische versie978-1-5386-3974-0
DOI's
StatusGepubliceerd - 31 okt. 2017
Evenement23rd European Conference on Circuit Theory and Design, ECCTD 2017 - Catania, Italië
Duur: 4 sep. 20176 sep. 2017
Congresnummer: 23
http://www.ecctd2017.dieei.unict.it/

Congres

Congres23rd European Conference on Circuit Theory and Design, ECCTD 2017
Verkorte titelECCTD 2017
Land/RegioItalië
StadCatania
Periode4/09/176/09/17
Internet adres

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