NoC Monitoring: Impact on the Design Flow

C. Ciordas, K.G.W. Goossens, A. Radulescu, T. Basten

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proceedings the IEEE International Symposium on Circuits and SYStems, 2006
Plaats van productie	Los Alamitos, USA
Uitgeverij	IEEE Computer Society
Pagina's	1981-1984
ISBN van geprinte versie	0-7803-9390-2
Status	Gepubliceerd - 2006
Evenement	conference; ASCAS 2006, Kos, greece; 2006-05-21; 2006-05-24 - Duur: 21 mei 2006 → 24 mei 2006

Citeer dit

@inproceedings{e75dce32ab494f598e90a348ead1d0e9,

title = "NoC Monitoring: Impact on the Design Flow",

author = "C. Ciordas and K.G.W. Goossens and A. Radulescu and T. Basten",

year = "2006",

language = "English",

isbn = "0-7803-9390-2",

pages = "1981--1984",

booktitle = "Proceedings the IEEE International Symposium on Circuits and SYStems, 2006",

publisher = "IEEE Computer Society",

address = "United States",

note = "conference; ASCAS 2006, Kos, greece; 2006-05-21; 2006-05-24 ; Conference date: 21-05-2006 Through 24-05-2006",

}

TY - GEN

T1 - NoC Monitoring: Impact on the Design Flow

AU - Ciordas, C.

AU - Goossens, K.G.W.

AU - Radulescu, A.

AU - Basten, T.

PY - 2006

Y1 - 2006

M3 - Conference contribution

SN - 0-7803-9390-2

SP - 1981

EP - 1984

BT - Proceedings the IEEE International Symposium on Circuits and SYStems, 2006

PB - IEEE Computer Society

CY - Los Alamitos, USA

T2 - conference; ASCAS 2006, Kos, greece; 2006-05-21; 2006-05-24

Y2 - 21 May 2006 through 24 May 2006

ER -