Natively textured ZnO grown by PECVD as front electrode material for amorphous silicon pin solar cells

J. Löffler, R.E.I. Schropp, R. Groenen, M.C.M. van de Sanden, J.L. Linden

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

3 Citaten (Scopus)

Samenvatting

Natively textured ZnO layers for the application as front electrode material in amorphous silicon pin solar cells have been deposited by Expanding Thermal Plasma Chemical Vapor Deposition. Films deposited in the temperature regime from 150 to 350°C at a rate between 0.65 and 0.75 nm/s have been characterteed with respect to their optical, electrical and structural properties. Results comparable to Asahi U-type SnO2:F have been obtained for these layers. First solar cells on ZnO, which was deposited at 250°C and 350°C, show an efficiency approaching 10%, only slightly lower than on Asahi U-type SnO2:F.

Originele taal-2Engels
TitelConference Record of the 28th IEEE Photovoltaic Specialists Conference - 2000
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's892-895
Aantal pagina's4
ISBN van geprinte versie0780357728
DOI's
StatusGepubliceerd - 1 jan. 2000
Evenement28th IEEE Photovoltaic Specialists Conference (PVSC 2000) - Anchorage Hilton Hotel, Anchorage, Verenigde Staten van Amerika
Duur: 15 sep. 200022 sep. 2000
Congresnummer: 28

Congres

Congres28th IEEE Photovoltaic Specialists Conference (PVSC 2000)
Verkorte titelPSVC 2000
Land/RegioVerenigde Staten van Amerika
StadAnchorage
Periode15/09/0022/09/00
AnderPVSC : IEEE Photovoltaic Specialists Conference ; 28 (Anchorage, Alas.) : 2000.09.15-22

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