Samenvatting
Natively textured ZnO layers for the application as front electrode material in amorphous silicon pin solar cells have been deposited by Expanding Thermal Plasma Chemical Vapor Deposition. Films deposited in the temperature regime from 150 to 350°C at a rate between 0.65 and 0.75 nm/s have been characterteed with respect to their optical, electrical and structural properties. Results comparable to Asahi U-type SnO2:F have been obtained for these layers. First solar cells on ZnO, which was deposited at 250°C and 350°C, show an efficiency approaching 10%, only slightly lower than on Asahi U-type SnO2:F.
Originele taal-2 | Engels |
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Titel | Conference Record of the 28th IEEE Photovoltaic Specialists Conference - 2000 |
Plaats van productie | Piscataway |
Uitgeverij | Institute of Electrical and Electronics Engineers |
Pagina's | 892-895 |
Aantal pagina's | 4 |
ISBN van geprinte versie | 0780357728 |
DOI's | |
Status | Gepubliceerd - 1 jan. 2000 |
Evenement | 28th IEEE Photovoltaic Specialists Conference (PVSC 2000) - Anchorage Hilton Hotel, Anchorage, Verenigde Staten van Amerika Duur: 15 sep. 2000 → 22 sep. 2000 Congresnummer: 28 |
Congres
Congres | 28th IEEE Photovoltaic Specialists Conference (PVSC 2000) |
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Verkorte titel | PSVC 2000 |
Land/Regio | Verenigde Staten van Amerika |
Stad | Anchorage |
Periode | 15/09/00 → 22/09/00 |
Ander | PVSC : IEEE Photovoltaic Specialists Conference ; 28 (Anchorage, Alas.) : 2000.09.15-22 |