Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

P. Putek, R. Janssen, J. Niehof, E.J.W. ter Maten, R. Pulch, B. Tasic, M. Günther

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Originele taal-2	Engels
Plaats van productie	Eindhoven
Uitgeverij	Technische Universiteit Eindhoven
Aantal pagina's	7
Status	Gepubliceerd - okt 2016

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title = "Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference",

author = "P. Putek and R. Janssen and J. Niehof and {ter Maten}, E.J.W. and R. Pulch and B. Tasic and M. G{\"u}nther",

year = "2016",

month = oct,

language = "English",

series = "CASA-report",

publisher = "Technische Universiteit Eindhoven",

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T1 - Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

AU - Putek, P.

AU - Janssen, R.

AU - Niehof, J.

AU - ter Maten, E.J.W.

AU - Pulch, R.

AU - Tasic, B.

AU - Günther, M.

PY - 2016/10

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M3 - Report

T3 - CASA-report

BT - Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

PB - Technische Universiteit Eindhoven

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