Multi-layer spatial iterative learning control for micro-additive manufacturing

Leontine Aarnoudse (Corresponding author), Christopher Pannier (Corresponding author), Zahra Afkhami, Tom Oomen, Kira Barton

Onderzoeksoutput: Bijdrage aan tijdschriftCongresartikelAcademicpeer review

1 Citaat (Scopus)
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Samenvatting

Spatial iterative learning control (SILC) has been used in the control of additive manufacturing systems that can be described by their spatial dynamics. Since the current framework is limited to single-layer parts, the aim of this paper is to provide an approach to multi-layer SILC using learning in the layer-to-layer dimension. Mathematical formulation of a multi-layer SILC controller is provided, and active feedback control is demonstrated to reduce the error accumulation over the iterations. Simulation results using a model of high-resolution e-jet printing verify performance improvements for the proposed framework.

Originele taal-2Engels
Pagina's (van-tot)97-102
Aantal pagina's6
TijdschriftIFAC-PapersOnLine
Volume52
Nummer van het tijdschrift15
DOI's
StatusGepubliceerd - sep 2019
Evenement8th IFAC Symposium on Mechatronic Systems, MECHATRONICS 2019 - Vienna, Oostenrijk
Duur: 4 sep 20196 sep 2019

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