Motion artifact analysis on scanning backlight LCD

Wen Song; Kees Teunissen; Xiaohua Li; Yuning Zhang; Xianchun Wang; Ingrid Heynderickx

doi:10.1889/1.3069339

Motion artifact analysis on scanning backlight LCD

Wen Song, Kees Teunissen, Xiaohua Li, Yuning Zhang, Xianchun Wang, Ingrid Heynderickx

Onderzoeksoutput: Bijdrage aan tijdschrift › Congresartikel › peer review

6 Citaten (Scopus)

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A simulation method based on temporal step response measurements is used to model motion artifacts of a scanningbacklight LCD-TV, including ghosts and color aberration. Simulation results are validated with perception experiments, and thus can be used to develop metrics predicting an LCD 's motion performance.

Originele taal-2	Engels
Pagina's (van-tot)	113-116
Aantal pagina's	4
Tijdschrift	Digest of Technical Papers - SID International Symposium
Volume	39
Nummer van het tijdschrift	1
DOI's	https://doi.org/10.1889/1.3069339
Status	Gepubliceerd - 1 jan. 2008
Extern gepubliceerd	Ja
Evenement	2008 SID International Symposium - Los Angeles, CA, Verenigde Staten van Amerika Duur: 20 mei 2008 → 21 mei 2008

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10.1889/1.3069339

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title = "Motion artifact analysis on scanning backlight LCD",

abstract = "A simulation method based on temporal step response measurements is used to model motion artifacts of a scanningbacklight LCD-TV, including ghosts and color aberration. Simulation results are validated with perception experiments, and thus can be used to develop metrics predicting an LCD 's motion performance.",

author = "Wen Song and Kees Teunissen and Xiaohua Li and Yuning Zhang and Xianchun Wang and Ingrid Heynderickx",

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AU - Teunissen, Kees

AU - Li, Xiaohua

AU - Zhang, Yuning

AU - Wang, Xianchun

AU - Heynderickx, Ingrid

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Motion artifact analysis on scanning backlight LCD

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