Modeling 1/f noise and extraction of the spice noise parameters using a new extraction procedure

M. van Heijningen, E.P. Vandamme, L. Deferm, L.K.J. Vandamme

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

8 Citaten (Scopus)
Originele taal-2Engels
TitelProc. 28th European Solid-State Device Research Conference
UitgeverijESSDERC'98
Pagina's468-471
StatusGepubliceerd - 1998
Evenementconference; Proc. 28th European Solid-State Device Research Conference, Bordeaux, France, 8-10 September 1998 -
Duur: 1 jan 1998 → …

Congres

Congresconference; Proc. 28th European Solid-State Device Research Conference, Bordeaux, France, 8-10 September 1998
Periode1/01/98 → …
AnderProc. 28th European Solid-State Device Research Conference, Bordeaux, France, 8-10 September 1998

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