MIMO-OFDM performance in relation to wideband channel properties

Pu Li, Haibin Zhang, Job Oostveen, Erik Fledderus

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

3 Citaten (Scopus)

Samenvatting

In this paper, the sensitivity of the error rate performance of MIMO-OFDM-based practical systems (WiMAX and LTE) to wide band channel properties is investigated. The behavior of the wideband channel is characterized in terms of delay spread (DS) and angular spread (AS). The impacts of DS and AS on the system performance are addressed with both qualitative and quantitative analyses. Two channel models are used for the quantitative analysis. The simulation results exemplify that a larger DS can result in lower error rate of OFDM systems, while a larger AS results in a lower error rate of MIMO systems. It is also observed that the DS sensitivity is higher in the region of low DS, which implies a more stringent accuracy requirement of DS prediction for radio planning.

Originele taal-2Engels
Titel2010 IEEE 21st International Symposium on Personal Indoor and Mobile Radio Communications, PIMRC 2010
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's2381-2386
Aantal pagina's6
ISBN van elektronische versie978-1-4244-8016-6
ISBN van geprinte versie978-1-4244-8017-3
DOI's
StatusGepubliceerd - 1 dec 2010
Evenement2010 IEEE 21st International Symposium on Personal Indoor and Mobile Radio Communications, PIMRC 2010 - Istanbul, Turkije
Duur: 26 sep 201030 sep 2010

Congres

Congres2010 IEEE 21st International Symposium on Personal Indoor and Mobile Radio Communications, PIMRC 2010
LandTurkije
StadIstanbul
Periode26/09/1030/09/10

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  • Citeer dit

    Li, P., Zhang, H., Oostveen, J., & Fledderus, E. (2010). MIMO-OFDM performance in relation to wideband channel properties. In 2010 IEEE 21st International Symposium on Personal Indoor and Mobile Radio Communications, PIMRC 2010 (blz. 2381-2386). [5671717] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/PIMRC.2010.5671717