Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

J.J.M. Kwaspen, H.C. Heyker

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
TitelProc. 1st STW Workshop on Semiconductor Advances for Future Electronics, SAFE 98
Pagina's347-350
StatusGepubliceerd - 1998
Evenement1998 ProRISC/IEEE workshop on Circuits, Systems and Signal Processing (CSSP98) and STW's Workshop on Semiconductor Advances for Future Electronics (SAFE98) - Mierlo, Nederland
Duur: 25 nov 199827 nov 1998

Congres

Congres1998 ProRISC/IEEE workshop on Circuits, Systems and Signal Processing (CSSP98) and STW's Workshop on Semiconductor Advances for Future Electronics (SAFE98)
Land/RegioNederland
StadMierlo
Periode25/11/9827/11/98
AnderProc. ProRISC/IEEE and STW's CSSP98/SAFE98, Mierlo, Netherlands, 25-27 November 1998

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