Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

J.J.M. Kwaspen, H.C. Heyker

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proc. 1997 IEEE/LEOS Benelux Chapter Symposium
Pagina's	217-220
Status	Gepubliceerd - 1997
Evenement	2nd Annual Symposium of the IEEE/LEOS Benelux Chapter - Eindhoven, Nederland Duur: 26 nov. 1997 → 26 nov. 1997

Congres	2nd Annual Symposium of the IEEE/LEOS Benelux Chapter
Land/Regio	Nederland
Stad	Eindhoven
Periode	26/11/97 → 26/11/97
Ander	Proc. 1997 IEEE/LEOS Benelux Chapter Symposium, Eindhoven, Netherlands, 26 November 1997

Citeer dit

@inproceedings{d1830d1494e44d0dadcdcd2975e3d971,

title = "Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs",

author = "J.J.M. Kwaspen and H.C. Heyker",

year = "1997",

language = "English",

isbn = "90-73461-13-8",

pages = "217--220",

booktitle = "Proc. 1997 IEEE/LEOS Benelux Chapter Symposium",

note = "2nd Annual Symposium of the IEEE/LEOS Benelux Chapter ; Conference date: 26-11-1997 Through 26-11-1997",

}

TY - GEN

T1 - Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

AU - Kwaspen, J.J.M.

AU - Heyker, H.C.

PY - 1997

Y1 - 1997

M3 - Conference contribution

SN - 90-73461-13-8

SP - 217

EP - 220

BT - Proc. 1997 IEEE/LEOS Benelux Chapter Symposium

T2 - 2nd Annual Symposium of the IEEE/LEOS Benelux Chapter

Y2 - 26 November 1997 through 26 November 1997

ER -