Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components

C.H. Berkel, van; M. Roncken; R.W.J.J. Saeijs

Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components

C.H. Berkel, van (Uitvinder), M. Roncken (Uitvinder), R.W.J.J. Saeijs (Uitvinder)

Onderzoeksoutput: Octrooi › Octrooi-publicatie

Originele taal-2	Engels
Octrooinummer	US Patent #5,590,275
Status	Gepubliceerd - 31 dec. 1996

Citeer dit

@misc{6de143ded8804fa8b1918126097a8bb2,

title = "Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components",

author = "{Berkel, van}, C.H. and M. Roncken and R.W.J.J. Saeijs",

year = "1996",

month = dec,

day = "31",

language = "English",

type = "Patent",

note = "US Patent #5,590,275",

}

Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components. / Berkel, van, C.H. (Uitvinder); Roncken, M. (Uitvinder); Saeijs, R.W.J.J. (Uitvinder).
Octrooi Nr.: US Patent #5,590,275. dec. 31, 1996.

Onderzoeksoutput: Octrooi › Octrooi-publicatie

TY - PAT

T1 - Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components

AU - Berkel, van, C.H.

AU - Roncken, M.

AU - Saeijs, R.W.J.J.

PY - 1996/12/31

Y1 - 1996/12/31

M3 - Patent publication

M1 - US Patent #5,590,275

ER -