Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components

C.H. Berkel, van (Uitvinder), M. Roncken (Uitvinder), R.W.J.J. Saeijs (Uitvinder)

    Onderzoeksoutput: OctrooiOctrooi-publicatie

    Originele taal-2Engels
    OctrooinummerUS Patent #5,590,275
    StatusGepubliceerd - 31 dec 1996

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