Method for polarization-resolved measurement of electroabsorption

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Photonic integrated circuits often use semiconductor components such as amplifiers, detectors, and electroabsorption modulators. For a proper circuit design, it is important to know the absorption spectrum of these semiconductor optical components and how it depends on an applied electric field. We propose a fast and accurate method that uses a compact segmented contact structure to measure the absorption characteristics. The method is based on measuring the transmission of amplified spontaneous emission (ASE) from a single forward-biased section through a varying number of reversely biased absorbing sections. Provided the ASE source emits light in both polarizations, the method measures the absorption spectra for both polarization modes simultaneously, without the need for a polarization filter in the measurement setup.

Originele taal-2Engels
Titel31st Annual Conference of the IEEE Photonics Society, IPC 2018
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Aantal pagina's11
ISBN van elektronische versie978-1-5386-5358-6
ISBN van geprinte versie978-1-5386-5359-3
StatusGepubliceerd - 6 nov. 2018
Evenement31st IEEE Photonics Conference, IPC 2018 - Reston, Verenigde Staten van Amerika
Duur: 30 sep. 20184 okt. 2018
Congresnummer: 31


Congres31st IEEE Photonics Conference, IPC 2018
Verkorte titelIPC 2018
Land/RegioVerenigde Staten van Amerika
Internet adres


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