Mechanically probing time-dependent mechanics in metallic MEMS

J.P.M. Hoefnagels, L.I.J.C. Bergers, N.K.R. Delhey, M.G.D. Geers

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

193 Downloads (Pure)

Samenvatting

The reliability of metallic micro-electromechanical systems (MEMS) depends on time-dependent deformation such as creep. To this end, a purely mechanical experimental methodology for studying the time-dependent deformation of free-standing microbeams has been developed. It is found most suitable for the investigation of creep due to the simplicity of sample handling and preparation and setup design, whilst maximizing long term stability and displacement resolution. The methodology entails the application of a constant deflection to a µm-sized free-standing aluminum cantilever beam for a prolonged period of time. After this load is removed, the deformation evolution is immediately recorded by acquiring surface height profiles through confocal optical profilometry. Image correlation and an algorithm based on elastic beam theory are applied to the full-field beam profiles to yield the tip deflection as a function of time. The methodology yields the tip deflection as function of time with ~3 nm precision.
Originele taal-2Engels
TitelMEMS and Nanotechnology - Proceedings of the 2010 Annual Conference on Experimental and Applied Mechanics
RedacteurenT. Proulx
Plaats van productieNew York
UitgeverijSpringer
Pagina's43-48
Aantal pagina's6
Volume2
ISBN van geprinte versie978-1-4419-8824-9
DOI's
StatusGepubliceerd - 2011
Evenement2010 Annual Conference on Experimental and Applied Mechanics - Indianapolis, Verenigde Staten van Amerika
Duur: 7 jun. 201010 jun. 2010

Congres

Congres2010 Annual Conference on Experimental and Applied Mechanics
Land/RegioVerenigde Staten van Amerika
StadIndianapolis
Periode7/06/1010/06/10

Vingerafdruk

Duik in de onderzoeksthema's van 'Mechanically probing time-dependent mechanics in metallic MEMS'. Samen vormen ze een unieke vingerafdruk.

Citeer dit