Mechanical failure prediction of copper/low-k interconnects in integrated circuits

B.A.E. Hal, van, R.H.J. Peerlings

Onderzoeksoutput: Bijdrage aan congres › Poster

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Originele taal-2Engels
StatusGepubliceerd - 2005
EvenementMate Poster Award 2005 : 10th Annual Poster Contest -
Duur: 1 jan. 2005 → …

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CongresMate Poster Award 2005 : 10th Annual Poster Contest
Periode1/01/05 → …
AnderMate Poster Award 2005 : 10th Annual Poster Contest

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