Measuring and modelling the bias dependent series resistance in submicron MOSFETs

J.A.M. Otten, F.M. Klaassen

Onderzoeksoutput: Boek/rapportRapportAcademic

Originele taal-2Engels
Plaats van productieEindhoven
UitgeverijTechnische Universiteit Eindhoven
Aantal pagina's60
StatusGepubliceerd - 1994

Bibliografische nota

Final report ESPRIT-ADWEUAT project 7236

Citeer dit

Otten, J. A. M., & Klaassen, F. M. (1994). Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven: Technische Universiteit Eindhoven.
Otten, J.A.M. ; Klaassen, F.M. / Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven : Technische Universiteit Eindhoven, 1994. 60 blz.
@book{d0576e448d354429b5f8aa80299a514e,
title = "Measuring and modelling the bias dependent series resistance in submicron MOSFETs",
author = "J.A.M. Otten and F.M. Klaassen",
note = "Final report ESPRIT-ADWEUAT project 7236",
year = "1994",
language = "English",
publisher = "Technische Universiteit Eindhoven",

}

Otten, JAM & Klaassen, FM 1994, Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Technische Universiteit Eindhoven, Eindhoven.

Measuring and modelling the bias dependent series resistance in submicron MOSFETs. / Otten, J.A.M.; Klaassen, F.M.

Eindhoven : Technische Universiteit Eindhoven, 1994. 60 blz.

Onderzoeksoutput: Boek/rapportRapportAcademic

TY - BOOK

T1 - Measuring and modelling the bias dependent series resistance in submicron MOSFETs

AU - Otten, J.A.M.

AU - Klaassen, F.M.

N1 - Final report ESPRIT-ADWEUAT project 7236

PY - 1994

Y1 - 1994

M3 - Report

BT - Measuring and modelling the bias dependent series resistance in submicron MOSFETs

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

Otten JAM, Klaassen FM. Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven: Technische Universiteit Eindhoven, 1994. 60 blz.