Measuring and modelling the bias dependent series resistance in submicron MOSFETs

J.A.M. Otten, F.M. Klaassen

Onderzoeksoutput: Boek/rapport › Rapport › Academic

Originele taal-2Engels
Plaats van productieEindhoven
UitgeverijTechnische Universiteit Eindhoven
Aantal pagina's60
StatusGepubliceerd - 1994

Bibliografische nota

Final report ESPRIT-ADWEUAT project 7236

Citeer dit

Otten, J. A. M., & Klaassen, F. M. (1994). Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven: Technische Universiteit Eindhoven.
Otten, J.A.M. ; Klaassen, F.M. / Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven : Technische Universiteit Eindhoven, 1994. 60 blz.
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Otten, JAM & Klaassen, FM 1994, Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Technische Universiteit Eindhoven, Eindhoven.

Measuring and modelling the bias dependent series resistance in submicron MOSFETs. / Otten, J.A.M.; Klaassen, F.M.

Eindhoven : Technische Universiteit Eindhoven, 1994. 60 blz.

Onderzoeksoutput: Boek/rapport › Rapport › Academic

TY - BOOK

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N1 - Final report ESPRIT-ADWEUAT project 7236

PY - 1994

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M3 - Report

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Otten JAM, Klaassen FM. Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven: Technische Universiteit Eindhoven, 1994. 60 blz.