Measurement of strain fields in the micron range

S.A. Onraet; W.P. Vellinga; M.G.D. Geers

Measurement of strain fields in the micron range

S.A. Onraet, W.P. Vellinga, M.G.D. Geers

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic

Originele taal-2	Engels
Titel	Proceedings 3rd international conference and poster exhibition micromaterials, MicroMat 2000, April 17-19, 2000, Berlin, Germany
Redacteuren	B. Michel
Plaats van productie	Dresden
Uitgeverij	Verlag DDP Goldenbogen
Pagina's	578-581
ISBN van geprinte versie	3-932434-15-3
Status	Gepubliceerd - 2000

Citeer dit

@inproceedings{e17827ab43ef4e6bb5a295210ea18160,

title = "Measurement of strain fields in the micron range",

author = "S.A. Onraet and W.P. Vellinga and M.G.D. Geers",

year = "2000",

language = "English",

isbn = "3-932434-15-3",

pages = "578--581",

editor = "B. Michel",

booktitle = "Proceedings 3rd international conference and poster exhibition micromaterials, MicroMat 2000, April 17-19, 2000, Berlin, Germany",

publisher = "Verlag DDP Goldenbogen",

}

Measurement of strain fields in the micron range. / Onraet, S.A.; Vellinga, W.P.; Geers, M.G.D.
Proceedings 3rd international conference and poster exhibition micromaterials, MicroMat 2000, April 17-19, 2000, Berlin, Germany. uitgave / B. Michel. Dresden: Verlag DDP Goldenbogen, 2000. blz. 578-581.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic

TY - GEN

T1 - Measurement of strain fields in the micron range

AU - Onraet, S.A.

AU - Vellinga, W.P.

AU - Geers, M.G.D.

PY - 2000

Y1 - 2000

M3 - Conference contribution

SN - 3-932434-15-3

SP - 578

EP - 581

BT - Proceedings 3rd international conference and poster exhibition micromaterials, MicroMat 2000, April 17-19, 2000, Berlin, Germany

A2 - Michel, B.

PB - Verlag DDP Goldenbogen

CY - Dresden

ER -