Measurement of diffracted electromagnetic fields behind a thin finite-width screen

G.A.J. van Dooren, M.G.J.J. Klaassen, M.H.A.J. Herben

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

13 Citaten (Scopus)

Samenvatting

A comparison between the measured and theoretically predicted site shielding factor (SSF) of a thin finite-width screen is made. The SSF, which expresses the additional attenuation caused by an obstacle on the propagation path, is measured along a cylindrical arc behind the screen at a frequency of 50 GHz. The measured SSF curves compare very well with those predicted by a theoretical model, which uses the uniform geometrical theory of diffraction (UTD) and includes corner diffraction. The same holds for the measured and theoretically derived time-domain results, which clearly demonstrate the ray behaviour of the diffracted fields, as assumed in the UTD.

Originele taal-2Engels
Pagina's (van-tot)1845-1847
Aantal pagina's3
TijdschriftElectronics Letters
Volume28
Nummer van het tijdschrift19
DOI's
StatusGepubliceerd - 10 sep 1992

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