Magnetic layer thickness dependence of the interlayer exchange coupling in (001) Co/Cu/Co

P.J.H. Bloemen, M.T.H. Vorst, van de, M.T. Johnson, R. Coehoorn, W.J.M. Jonge, de

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A dependence of the strength of the antiferromagnetic coupling across Cu on the Co layer thickness has been observed. The Co thickness dependence displays two clear peaks consistent with the recently predicted oscillation period of 6.2 Å Co. Apart from the two peaks also several small peaks are visible on a scale of about 1 monolayer Co. Free-electron calculations indicate that these rapid variations in strength may result from slight differences between the slopes and starting points of the two Co wedges that were involved in the experiment. Journal of Applied Physics is copyrighted by The American Institute of Physics.
Originele taal-2Engels
Pagina's (van-tot)7081-7083
Aantal pagina's3
TijdschriftJournal of Applied Physics
Nummer van het tijdschrift10
StatusGepubliceerd - 1995


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