Low frequency noise as a diagnostic tool for quality assessment of MOSFETs

E.P. Vandamme, C. Claeys, L.K.J. Vandamme

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proc. ELEN Workshop
Pagina's	107-114
Status	Gepubliceerd - 1994
Evenement	conference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994 - Duur: 1 jan. 1994 → …

Congres	conference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994
Periode	1/01/94 → …
Ander	Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994

Citeer dit

@inproceedings{8018a74a4bd942a9ac04aa4cc1b61ea2,

title = "Low frequency noise as a diagnostic tool for quality assessment of MOSFETs",

author = "E.P. Vandamme and C. Claeys and L.K.J. Vandamme",

year = "1994",

language = "English",

pages = "107--114",

booktitle = "Proc. ELEN Workshop",

note = "conference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994 ; Conference date: 01-01-1994",

}