Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy

T. Hallam, M. Lee, N. Zhao, I. Nandhakumar, M. Kemerink, M. Heeney, I. McCulloch, H. Sirringhaus

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

63 Citaten (Scopus)
165 Downloads (Pure)

Samenvatting

The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.
Originele taal-2Engels
Artikelnummer256803
Pagina's (van-tot)256803-1/4
Aantal pagina's4
TijdschriftPhysical Review Letters
Volume103
Nummer van het tijdschrift25
DOI's
StatusGepubliceerd - 2009

Vingerafdruk

Duik in de onderzoeksthema's van 'Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy'. Samen vormen ze een unieke vingerafdruk.

Citeer dit