Layout-driven SOC test architecture design for test time and wire length minimization

S.K. Goel, E.J. Marinissen

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureHoofdstukAcademicpeer review

31 Citaten (Scopus)

Samenvatting

This paper extends existing SOC test architecture design approaches that minimize required tester vector memory depth and test application time, with the capability to minimize the wire length required by the test architecture. We present a simple, Yet effective wire length cost model for test architectures together with a new test architecture design algorithm that minimizes both test time and wire length. The user specifies the relative weight of the costs of test time versus wire length. In an integrated fashion, the algorithm partitions the total available TAM width over individual TAMs, assigns the modules to these TAMs, and orders the modules within one TAM such that the total cost is minimized. Experimental results on five benchmark SOCs show that we can ()brain savings of up to 86% in wiring costs at the expense of <4% in test time.
Originele taal-2Engels
Titel2003 Design, Automation and Test in Europe Conference and Exhibition
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's738-743
ISBN van geprinte versie0-7695-1870-2
DOI's
StatusGepubliceerd - 2003
Extern gepubliceerdJa
Evenement6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) - Munich, Duitsland
Duur: 7 mrt 20037 mrt 2003

Congres

Congres6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003)
Verkorte titelDATE'03
Land/RegioDuitsland
StadMunich
Periode7/03/037/03/03
AnderDATE'03, Munich, Germany

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