Large-Scale H2 Optimization for Thermo-Mechanical Reliability of Electronics

Pascal den Boef; Jos Maubach; Wil Schilders; Nathan van de Wouw

doi:10.1007/978-3-031-54517-7_16

Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics

Pascal den Boef, Jos Maubach, Wil Schilders, Nathan van de Wouw

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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Optimization of transient models is required in several domains related to thermo-mechanical reliability of electronics, such as Prognostic Health Monitoring (PHM) and design optimization. A novel framework for efficient (local) parameter optimization of transient models in the H₂ norm is proposed. The optimization is feasible for large-scale transient models because it approximates the gradient using physics-based model order reduction (MOR), in contrast to existing approaches that typically use data-driven surrogate models such as neural networks. To demonstrate the framework an optimal fixed-order virtual sensor for PHM of a Ball Grid Array (BGA) is numerically determined.

Originele taal-2	Engels
Titel	Scientific Computing in Electrical Engineering
Subtitel	SCEE 2022, Amsterdam, The Netherlands, July 2022
Redacteuren	Martijn van Beurden, Neil V. Budko, Gabriela Ciuprina, Wil Schilders, Harshit Bansal, Ruxandra Barbulescu
Plaats van productie	Cham
Uitgeverij	Springer
Pagina's	144-151
Aantal pagina's	8
ISBN van elektronische versie	978-3-031-54517-7
ISBN van geprinte versie	978-3-031-54516-0
DOI's	https://doi.org/10.1007/978-3-031-54517-7_16
Status	Gepubliceerd - 1 mrt. 2024
Evenement	Scientific Computing in Electrical Engineering, SCEE 2022 - Amsterdam, Nederland Duur: 11 jul. 2022 → 14 jul. 2022 https://www.scee-conferences.org/

Publicatie series

Naam	Mathematics in Industry
Volume	43
ISSN van geprinte versie	1612-3956
ISSN van elektronische versie	2198-3283

Congres

Congres	Scientific Computing in Electrical Engineering, SCEE 2022
Verkorte titel	SCEE 2022
Land/Regio	Nederland
Stad	Amsterdam
Periode	11/07/22 → 14/07/22
Internet adres	https://www.scee-conferences.org/

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10.1007/978-3-031-54517-7_16

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den Boef, P., Maubach, J., Schilders, W., & van de Wouw, N. (2024). Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. In M. van Beurden, N. V. Budko, G. Ciuprina, W. Schilders, H. Bansal, & R. Barbulescu (editors), Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022 (blz. 144-151). (Mathematics in Industry; Vol. 43). Springer. https://doi.org/10.1007/978-3-031-54517-7_16

den Boef, Pascal ; Maubach, Jos ; Schilders, Wil et al. / Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. redacteur / Martijn van Beurden ; Neil V. Budko ; Gabriela Ciuprina ; Wil Schilders ; Harshit Bansal ; Ruxandra Barbulescu. Cham : Springer, 2024. blz. 144-151 (Mathematics in Industry).

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abstract = "Optimization of transient models is required in several domains related to thermo-mechanical reliability of electronics, such as Prognostic Health Monitoring (PHM) and design optimization. A novel framework for efficient (local) parameter optimization of transient models in the H2 norm is proposed. The optimization is feasible for large-scale transient models because it approximates the gradient using physics-based model order reduction (MOR), in contrast to existing approaches that typically use data-driven surrogate models such as neural networks. To demonstrate the framework an optimal fixed-order virtual sensor for PHM of a Ball Grid Array (BGA) is numerically determined.",

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den Boef, P , Maubach, J , Schilders, W & van de Wouw, N 2024, Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. in M van Beurden, NV Budko, G Ciuprina, W Schilders, H Bansal & R Barbulescu (uitgave), Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. Mathematics in Industry, vol. 43, Springer, Cham, blz. 144-151, Scientific Computing in Electrical Engineering, SCEE 2022, Amsterdam, Nederland, 11/07/22. https://doi.org/10.1007/978-3-031-54517-7_16

Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. / den Boef, Pascal ; Maubach, Jos ; Schilders, Wil et al.
Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. uitgave / Martijn van Beurden; Neil V. Budko; Gabriela Ciuprina; Wil Schilders; Harshit Bansal; Ruxandra Barbulescu. Cham: Springer, 2024. blz. 144-151 (Mathematics in Industry; Vol. 43).

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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den Boef P , Maubach J , Schilders W , van de Wouw N. Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. In van Beurden M, Budko NV, Ciuprina G, Schilders W, Bansal H, Barbulescu R, redacteurs, Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. Cham: Springer. 2024. blz. 144-151. (Mathematics in Industry). doi: 10.1007/978-3-031-54517-7_16

Large-Scale H2 Optimization for Thermo-Mechanical Reliability of Electronics