Ion beam analysis at cryogenic temperatures for polymer light emitting diodes

L.J. IJzendoorn, van; M.P. Jong, de; F.J.J. Janssen; G.G. Andersson; J.M. Sturm; M.J.A. Voigt, de

doi:10.1016/S0168-583X(01)01005-9

Ion beam analysis at cryogenic temperatures for polymer light emitting diodes

L.J. IJzendoorn, van, M.P. Jong, de, F.J.J. Janssen, G.G. Andersson, J.M. Sturm, M.J.A. Voigt, de

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

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A review. The application of ion beam anal. on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temps. (10-30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A no. of examples are reviewed in which interface stability and oxidn. effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection

Originele taal-2	Engels
Pagina's (van-tot)	36-40
Tijdschrift	Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume	188
Nummer van het tijdschrift	1-4
DOI's	https://doi.org/10.1016/S0168-583X(01)01005-9
Status	Gepubliceerd - 2002

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IJzendoorn, van, L. J., Jong, de, M. P., Janssen, F. J. J., Andersson, G. G., Sturm, J. M., & Voigt, de, M. J. A. (2002). Ion beam analysis at cryogenic temperatures for polymer light emitting diodes. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 188(1-4), 36-40. https://doi.org/10.1016/S0168-583X(01)01005-9

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abstract = "A review. The application of ion beam anal. on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temps. (10-30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A no. of examples are reviewed in which interface stability and oxidn. effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection",

author = "{IJzendoorn, van}, L.J. and {Jong, de}, M.P. and F.J.J. Janssen and G.G. Andersson and J.M. Sturm and {Voigt, de}, M.J.A.",

year = "2002",

doi = "10.1016/S0168-583X(01)01005-9",

language = "English",

volume = "188",

pages = "36--40",

journal = "Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

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}

Ion beam analysis at cryogenic temperatures for polymer light emitting diodes. / IJzendoorn, van, L.J.; Jong, de, M.P.; Janssen, F.J.J.; Andersson, G.G.; Sturm, J.M.; Voigt, de, M.J.A.

In: Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 188, Nr. 1-4, 2002, blz. 36-40.

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

TY - JOUR

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AU - IJzendoorn, van, L.J.

AU - Jong, de, M.P.

AU - Janssen, F.J.J.

AU - Andersson, G.G.

AU - Sturm, J.M.

AU - Voigt, de, M.J.A.

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AB - A review. The application of ion beam anal. on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temps. (10-30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A no. of examples are reviewed in which interface stability and oxidn. effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection

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DO - 10.1016/S0168-583X(01)01005-9

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EP - 40

JO - Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

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Ion beam analysis at cryogenic temperatures for polymer light emitting diodes

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