Ion beam analysis at cryogenic temperatures for polymer light emitting diodes

L.J. IJzendoorn, van, M.P. Jong, de, F.J.J. Janssen, G.G. Andersson, J.M. Sturm, M.J.A. Voigt, de

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

    Samenvatting

    A review. The application of ion beam anal. on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temps. (10-30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A no. of examples are reviewed in which interface stability and oxidn. effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection
    Originele taal-2Engels
    Pagina's (van-tot)36-40
    TijdschriftNuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
    Volume188
    Nummer van het tijdschrift1-4
    DOI's
    StatusGepubliceerd - 2002

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