TY - JOUR
T1 - Investigation on the origin of terahertz waves generated by dc-biased multimode semiconductor lasers at room temperature
AU - Latkowski, Sylwester
AU - Surre, Frederic
AU - Maldonado-Basilio, Ramon
AU - Landais, Pascal
PY - 2008/12/1
Y1 - 2008/12/1
N2 - A technique to measure a terahertz wave generated by spectrum tailored
Fabry-Pérot lasers (FP) is assessed. A dc-biased and 25 °C
temperature controlled FP is probed by a continuous wave signal, tuned
at 20 nm away from its lasing modes. With a 0.02 nm resolution optical
spectrum analyzer (OSA), the terahertz generated signal frequency is
measured from the interval between the probe and its side-band
modulations. The terahertz waves emitted by these FPs are measured at
370±5 GHz and at 1.157±0.005 THz, respectively, within a
precision set by our OSA. The origin of the terahertz wave is due to
passive mode-locked through intracavity four-wave-mixing processes.
AB - A technique to measure a terahertz wave generated by spectrum tailored
Fabry-Pérot lasers (FP) is assessed. A dc-biased and 25 °C
temperature controlled FP is probed by a continuous wave signal, tuned
at 20 nm away from its lasing modes. With a 0.02 nm resolution optical
spectrum analyzer (OSA), the terahertz generated signal frequency is
measured from the interval between the probe and its side-band
modulations. The terahertz waves emitted by these FPs are measured at
370±5 GHz and at 1.157±0.005 THz, respectively, within a
precision set by our OSA. The origin of the terahertz wave is due to
passive mode-locked through intracavity four-wave-mixing processes.
KW - Radiowave and microwave technology
KW - Semiconductor lasers
KW - laser diodes
KW - Modulation tuning and mode locking
KW - Phase conjugation
KW - photorefractive and Kerr effects
U2 - 10.1063/1.3050455
DO - 10.1063/1.3050455
M3 - Article
SN - 0003-6951
VL - 93
SP - 241110
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 24
ER -