Samenvatting
The authors found that oxygen plasma etching of polyimide (PI) with aluminum (Al) as a hard-etch mask results in lightly textured arbitrary shaped “fur-like” residues. Upon investigation, the presence of Al was detected in these residues. Ruling out several causes of metal contamination that were already reported in literature, a new theory for the presence of the metal containing residues is described. Furthermore, different methods for the residue free etching of PI using an Al hard-etch by using different metal deposition and patterning methods are explored. A fur-free procedure for the etching of PI using a one step-reactive ion etch of the metal hard-etch mask is presented.
Originele taal-2 | Engels |
---|---|
Pagina's (van-tot) | 130-135 |
Aantal pagina's | 6 |
Tijdschrift | Materials Science in Semiconductor Processing |
Volume | 75 |
DOI's | |
Status | Gepubliceerd - 1 mrt. 2018 |