Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

D. Konstantinou; C. Caillaud; S. Rommel; U. Johannsen; I. Tafur Monroy

doi:10.23919/EuMC48046.2021.9338063

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

D. Konstantinou, C. Caillaud, S. Rommel, U. Johannsen, I. Tafur Monroy

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

2 Citaten (Scopus)

110 Downloads (Pure)

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This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

Originele taal-2	Engels
Titel	2020 50th European Microwave Conference, EuMC 2020
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	320-323
Aantal pagina's	4
ISBN van elektronische versie	9782874870590
DOI's	https://doi.org/10.23919/EuMC48046.2021.9338063
Status	Gepubliceerd - 2 feb. 2021
Evenement	2020 50th European Microwave Conference (EuMC) - Utrecht, Netherlands, Utrecht, Nederland Duur: 12 jan. 2021 → 14 jan. 2021 Congresnummer: 50

Congres

Congres	2020 50th European Microwave Conference (EuMC)
Verkorte titel	EuMC 2020
Land/Regio	Nederland
Stad	Utrecht
Periode	12/01/21 → 14/01/21

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10.23919/EuMC48046.2021.9338063

eumc_authors_versionFinale auteursversie , 651 KB

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Link to publication in Scopus

5G-PHOS: 5G PHOS
Tafur Monroy, I., Witteveen, F., Johannsen, U., Patterson, D., Okonkwo, C. M., Sanders, R. & Rommel, S.
1/09/17 → 31/08/21
Project: Onderzoek direct
BlueSpace
Tafur Monroy, I., Rommel, S., Patterson, D., Cimoli, B., Witteveen, F., Sanders, R. & Barros Carvalho, J.
1/06/17 → 31/05/20
Project: Onderzoek direct
5G STEP FWD
Tafur Monroy, I., Witteveen, F., Konstantinou, D., Perez Santacruz, J., Sanders, R., Rommel, S. & Tafur Monroy, I.
1/06/17 → 1/05/23
Project: Onderzoek direct

Citeer dit

@inproceedings{cd253c1b800145a38960f6bdba4ca15b,

title = "Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes",

abstract = "This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.",

keywords = "UTC-PDs, de-embedding, microwave photonics",

author = "D. Konstantinou and C. Caillaud and S. Rommel and U. Johannsen and Monroy, {I. Tafur}",

year = "2021",

month = feb,

day = "2",

doi = "10.23919/EuMC48046.2021.9338063",

language = "English",

pages = "320--323",

booktitle = "2020 50th European Microwave Conference, EuMC 2020",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "50th European Microwave Conference (EuMC 2020), EuMC 2020 ; Conference date: 12-01-2021 Through 14-01-2021",

}

Konstantinou, D, Caillaud, C, Rommel, S , Johannsen, U & Monroy, IT 2021, Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes. in 2020 50th European Microwave Conference, EuMC 2020., 9338063, Institute of Electrical and Electronics Engineers, blz. 320-323, 2020 50th European Microwave Conference (EuMC), Utrecht, Nederland, 12/01/21. https://doi.org/10.23919/EuMC48046.2021.9338063

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes. / Konstantinou, D.; Caillaud, C.; Rommel, S. et al.
2020 50th European Microwave Conference, EuMC 2020. Institute of Electrical and Electronics Engineers, 2021. blz. 320-323 9338063.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

AU - Konstantinou, D.

AU - Caillaud, C.

AU - Rommel, S.

AU - Johannsen, U.

AU - Monroy, I. Tafur

N1 - Conference code: 50

PY - 2021/2/2

Y1 - 2021/2/2

N2 - This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

AB - This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

KW - UTC-PDs

KW - de-embedding

KW - microwave photonics

UR - http://www.scopus.com/inward/record.url?scp=85100936625&partnerID=8YFLogxK

U2 - 10.23919/EuMC48046.2021.9338063

DO - 10.23919/EuMC48046.2021.9338063

M3 - Conference contribution

SP - 320

EP - 323

BT - 2020 50th European Microwave Conference, EuMC 2020

PB - Institute of Electrical and Electronics Engineers

T2 - 50th European Microwave Conference (EuMC 2020)

Y2 - 12 January 2021 through 14 January 2021

ER -

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

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Congres

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Projecten

5G-PHOS: 5G PHOS

BlueSpace

5G STEP FWD

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