Integrated sensing for additive manufacturing of ceramic components

R. Smits

    Onderzoeksoutput: ScriptieEngD Thesis


    Additive manufacturing (AM) is a relatively new production technology which is currently shifting from a method for rapid prototyping into a mature production method for end products. The goal of the AMSYSTEMS Center is to accelerate (new ways of) AM in diverse industries. One of these industries is the high-tech industry in which there is a potential market for the AM of high-end ceramic components. For this reason, the AMSYSTEMS Center is developing the Lepus Next Gen (LNXG) technology, a functional prototype for stereolithography of ceramics which enables fast production of large area components. Currently, errors made during this process are uncorrected, and have the possibility to accumulate, causing deviations and loss of quality in the final product. The AMSYSTEMS Center is investigating whether these errors can be suppressed, and the product quality improved, by implementing feedback control. This PDEng project focuses on the sensing necessary for the realization of these control loops. The project goal is defined as: select, design and implement sensing systems to enable feedback control loops on the LNXG. This project aims at selecting, designing and implementing two sensing systems:
    • Degree of Conversion (DoC) sensing
    • Surface topography sensing
    To achieve this DoC sensing, detailed target specifications are established. A literature study, experiments and calculations have been performed to explore different sensing concepts. From this analysis, near infrared (NIR) spectroscopy is selected.
    In future projects, concerning this feedback loop technology, the selected NIR technology can be further developed by performing additional tests, purchasing equipment and implementation into the LNXG.
    For the surface topography sensing, also detailed target specifications are established, and literature study, experiments and calculations have been performed. From this analysis confocal chromatic sensing (CCS) is selected for surface topography sensing. A CCS point scanner has been purchased for the implementation of surface topography sensing. Meanwhile, a borrowed CCS point scanner was used for proof-of-concept experiments on the LNXG. These tests demonstrate that CCS is suitable to detect errors in the surface topography during the manufacturing which may be the source of reduced quality in the final product.
    For further development of the surface topography sensing, a light and stiff stage should be developed to reduce the vibrations associated with the scanning motion. After this, a control strategy can be developed for closing the feedback control loop.
    Originele taal-2Engels
    • van Baars, Gregor E., Begeleider
    • Etman, L.F.P. (Pascal), Begeleider
    • van Dijk, Jan, Begeleider
    • Koning, J.J., Begeleider
    Datum van toekenning7 feb. 2019
    Plaats van publicatieEindhoven
    StatusGepubliceerd - 27 mrt. 2019

    Bibliografische nota

    PdEng thesis.


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