Infulence of substrate noise on RF performance

D.M.W. Leenaerts, P. Vreede, de

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

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Samenvatting

A low-ohmic substrate 0.25µm CMOS process has been chosen to carry out experiments to measure the effects of substrate noise on the performance of circuits operating at radio frequencies. Clock circuits give rise to substrate noise with spectral harmonics far into the RF band. These harmonics are injected into the signal path of RF circuitry as will be demonstrated. Clock planning is therefore a major issue in mixed-signal telecommunication.
Originele taal-2Engels
TitelESSCIRC, proceedings of the 26th European Solid-State Circuits Conference, Stockholm, Sweden, 19-21 Sept. 2000
Pagina's300-303
StatusGepubliceerd - 2000

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  • Citeer dit

    Leenaerts, D. M. W., & Vreede, de, P. (2000). Infulence of substrate noise on RF performance. In ESSCIRC, proceedings of the 26th European Solid-State Circuits Conference, Stockholm, Sweden, 19-21 Sept. 2000 (blz. 300-303)