Influence of substrate noise on RF performance

Domine Leenaerts, Peter de Vreede

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

13 Citaten (Scopus)

Samenvatting

A low-ohmic substrate 0.25μm CMOS process has been chosen to carry out experiments to measure the effects of substrate noise on the performance of circuits operating at radio frequencies. Clock circuits give rise to substrate noise with spectral harmonics far into the RF band. These harmonics are injected into the signal path of RF circuitry as will be demonstrated. Clock planning is therefore a major issue in mixed-signal telecommunication.

Originele taal-2Engels
TitelESSCIRC‘2000
Subtitel26th European Solid-State Circuits Conference 19 – 21 September 2000 Stockholm, Sweden
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's328-331
Aantal pagina's4
StatusGepubliceerd - 1 aug. 2005
Evenement26th European Solid-State Circuits Conference, ESSCIRC 2000 - Stockholm, Zweden
Duur: 19 sep. 200021 sep. 2000

Congres

Congres26th European Solid-State Circuits Conference, ESSCIRC 2000
Land/RegioZweden
StadStockholm
Periode19/09/0021/09/00

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