Influence of Noise on Scattering-Parameter Measurements

Dazhen Gu; Jeffrey Jargon; Matthew Ryan; A. Hubrechsen

doi:10.1109/TMTT.2020.3014627

Influence of Noise on Scattering-Parameter Measurements

Dazhen Gu (Corresponding author), Jeffrey Jargon, Matthew Ryan, A. Hubrechsen

Electrical Energy Systems

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We present a general model of noisy scattering parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear as a complex Gaussian quotient. The statistical analysis of the residual error is given and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.

Originele taal-2	Engels
Pagina's (van-tot)	4925-4939
Aantal pagina's	15
Tijdschrift	IEEE Transactions on Microwave Theory and Techniques
Volume	68
Nummer van het tijdschrift	11
DOI's	https://doi.org/10.1109/TMTT.2020.3014627
Status	Gepubliceerd - 1 nov 2020

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abstract = "We present a general model of noisy scattering parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear as a complex Gaussian quotient. The statistical analysis of the residual error is given and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.",

keywords = "Network analysis, Noise, Probability distribution, Random variable, Scattering parameter, Uncertainty",

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AU - Gu, Dazhen

AU - Jargon, Jeffrey

AU - Ryan, Matthew

AU - Hubrechsen, A.

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Y1 - 2020/11/1

N2 - We present a general model of noisy scattering parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear as a complex Gaussian quotient. The statistical analysis of the residual error is given and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.

AB - We present a general model of noisy scattering parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear as a complex Gaussian quotient. The statistical analysis of the residual error is given and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.

KW - Network analysis

KW - Noise

KW - Probability distribution

KW - Random variable

KW - Scattering parameter

KW - Uncertainty

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JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

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ER -

Influence of Noise on Scattering-Parameter Measurements

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