Samenvatting
We present a general model of noisy scattering parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear as a complex Gaussian quotient. The statistical analysis of the residual error is given and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.
| Originele taal-2 | Engels |
|---|---|
| Pagina's (van-tot) | 4925-4939 |
| Aantal pagina's | 15 |
| Tijdschrift | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 68 |
| Nummer van het tijdschrift | 11 |
| DOI's | |
| Status | Gepubliceerd - 1 nov. 2020 |
Financiering
Manuscript received March 24, 2020; revised June 18, 2020; accepted July 14, 2020. Date of publication August 18, 2020; date of current version November 4, 2020. This work was supported by the National Institute of Standards and Technology, an agency of the U.S. government, and is not subject to the U.S. copyright. (Corresponding author: Dazhen Gu.) Dazhen Gu and Jeffrey A. Jargon are with the RF Technology Division, National Institute of Standards and Technology, Boulder, CO 80305 USA (e-mail: [email protected]).
| Financiers | Financiernummer |
|---|---|
| National Institute of Standards and Technology |